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For the Inventor, By the Inventor

Tokyo, Japan

Kenji Tanimoto

This inventor holds 26 USPTO granted patents and 3 published patent applications, primarily in Charged Particle Beams. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation, Hitachi, Ltd.. Active years: 2003-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenji Tanimoto. Retrieved from https://idiyas.com/inventor/kenji-tanimoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 26 

% Patents Active = 73.1

Average Co-Inventor Count = 4.8

ph-index = 5

Forward Citations = 138(Granted Patents)


Location History:

  • Hitachinaka, JP (2003 - 2013)
  • Tokyo, JP (2015 - 2024)

Company Filing History:

goldMedal12 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal11 out of 1,409 
 
Hitachi High-Tech Corporation
 patents
bronzeMedal3 out of 42,752 
 
Hitachi, Ltd.
 patents

Years Active: 2003-2026

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Areas of Expertise:
Particle Acceleration
Electron Source
Electron Gun
Pattern Measurement
Scanning Electron Microscope
Charged Particle Beam Device
Semiconductor Inspection
Overlay Misalignment
Inspection Method
Focus Adjustment
26 patents (USPTO):Explore Patents
1. 12586748 - Structure for particle acceleration and charged particle beam apparatus (2026-03-24),
2. 12469665 - Charged particle beam device (2025-11-11),
3. 12394586 - Charged particle beam device (2025-08-19),
4. 12394585 - Electron source, electron gun, and charged particle beam device (2025-08-19),
5. 12174551 - Pattern measurement device and pattern measurement method (2024-12-24),
6. 12068128 - Charged particle beam system (2024-08-20),
7. 11670479 - Electron microscope and method of adjusting focus of electron microscope (2023-06-06),
8. 11626266 - Charged particle beam device (2023-04-11),
9. 11353798 - Pattern measurement device and pattern measurement method (2022-06-07),
10. 11276554 - Scanning electron microscope and method for measuring pattern (2022-03-15),
11. 11251018 - Scanning electron microscope (2022-02-15),
12. 10903037 - Charged particle beam device (2021-01-26),
13. 10816332 - Pattern measurement device and pattern measurement method (2020-10-27),
14. 10636618 - Charged particle beam apparatus (2020-04-28),
15. 10629408 - Charged particle beam device (2020-04-21),

Title: Kenji Tanimoto - Innovative Inventor from Tokyo

Introduction: Kenji Tanimoto is a renowned inventor based in Tokyo, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Kenji Tanimoto holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous innovation and forward-thinking approach.

Career Highlights: With over two decades of experience in the industry, Kenji Tanimoto has led numerous research projects that have resulted in cutting-edge inventions, earning him recognition as a pioneer in the field of technology.

Collaborations: Throughout his career, Kenji Tanimoto has collaborated with leading research institutions, universities, and tech companies worldwide, fostering a culture of innovation and knowledge exchange.

Conclusion: Kenji Tanimoto's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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