The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Oct. 19, 2021
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Keigo Kasuya, Tokyo, JP;

Shuhei Ishikawa, Tokyo, JP;

Kenji Tanimoto, Tokyo, JP;

Shunichi Watanabe, Tokyo, JP;

Takashi Doi, Tokyo, JP;

Yusuke Sakai, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/073 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/073 (2013.01); H01J 37/28 (2013.01); H01J 2237/04735 (2013.01); H01J 2237/06341 (2013.01);
Abstract

Provided is a charged particle beam device that can precisely manage a temperature at which a cold field emitter is heated. A charged particle beam device includes: a cold field emitter including a tip having a sharpened distal end, a filament connected to the tip, and an auxiliary electrode covering the filament and having an opening from which the tip protrudes; an extraction electrode to which an extraction voltage for extracting electrons from the cold field emitter is applied; and an acceleration electrode to which an acceleration voltage for accelerating the electrons extracted from the cold field emitter is applied. When the tip and the filament are heated, thermionic electrons emitted from the tip and the filament are collected by the auxiliary electrode to measure a current by applying a positive voltage with respect to the tip to the auxiliary electrode.


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