The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

Jun. 29, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Keigo Kasuya, Tokyo, JP;

Shuhei Ishikawa, Tokyo, JP;

Kenji Tanimoto, Tokyo, JP;

Takashi Doi, Tokyo, JP;

Soichiro Matsunaga, Tokyo, JP;

Hiroshi Morita, Tokyo, JP;

Daigo Komesu, Tokyo, JP;

Kenji Miyata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/065 (2006.01); H01J 37/073 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/065 (2013.01); H01J 37/073 (2013.01); H01J 37/28 (2013.01);
Abstract

In an electron source including a suppressor electrode having an opening at one end portion thereof in a direction along a central axis and an electron emission material having a distal end protruding from the opening, the suppressor electrode further includes a receding portion receding to a position farther from the distal end of the electron emission material than the opening in the direction along the central axis at a position in an outer peripheral direction than the opening, and at least a part of the receding portion is disposed within a diameter of 2810 μm from a center of the opening. Accordingly, an electron source, an electron gun, and a charged particle beam device such as an electron microscope using the same, in which a machine difference in a device performance due to an axial shift between the electron emission material and the suppressor electrode is reduced, are implemented.


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