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For the Inventor, By the Inventor

Tokyo, Japan

Kenichi Suematsu

USPTO Granted Patents = 16

 

Average Co-Inventor Count = 4.6

ph-index = 6

Forward Citations = 193(Granted Patents)


Location History:

  • Yokohama, JP (2008)
  • Kanagawa-ken, JP (2006 - 2016)
  • Tokyo, JP (2011 - 2019)

Company Filing History:

goldMedal16 out of 2,514 
 
Ebara Corporation
 patents

Years Active: 2006-2019

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16 patents (USPTO):Explore Patents
1. 10446404 - Electron-beam irradiated area adjustment method and adjustment system, electron-beam irradiated region correction method, and electron beam irradiation apparatus (2019-10-15),
2. 10074510 - Inspection system and inspection image data generation method (2018-09-11),
3. 10002740 - Inspection device (2018-06-19),
4. 9852878 - Surface processing apparatus (2017-12-26),
5. 9760984 - Control unit for generating timing signal for imaging unit in inspection system and method for sending out timing signal to imaging unit (2017-09-12),
6. 9406480 - Testing apparatus using charged particles and device manufacturing method using the testing apparatus (2016-08-02),
7. 9105445 - Inspection system, inspection image data generation method, inspection display unit, defect determination method, and storage medium on which inspection display program is recorded (2015-08-11),
8. 8946631 - Testing apparatus using charged particles and device manufacturing method using the testing apparatus (2015-02-03),
9. 8796621 - Detector and inspecting apparatus (2014-08-05),
10. 8742341 - Testing apparatus using charged particles and device manufacturing method using the testing apparatus (2014-06-03),
11. 8431892 - Detector and inspecting apparatus (2013-04-30),
12. 7928382 - Detector and inspecting apparatus (2011-04-19),
13. 7741601 - Testing apparatus using charged particles and device manufacturing method using the testing apparatus (2010-06-22),
14. 7425703 - Electron beam apparatus, a device manufacturing method using the same apparatus, a pattern evaluation method, a device manufacturing method using the same method, and a resist pattern or processed wafer evaluation method (2008-09-16),
15. 7365324 - Testing apparatus using charged particles and device manufacturing method using the testing apparatus (2008-04-29),

Title: Kenichi Suematsu: Pioneering Inventor from Tokyo

Introduction: Kenichi Suematsu is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Kenichi Suematsu holds several patents in the areas of robotics, artificial intelligence, and renewable energy, showcasing his innovative spirit and forward-thinking approach.

Career Highlights: With over two decades of experience in the tech industry, Kenichi Suematsu has worked with leading companies in Japan and internationally, spearheading projects that have revolutionized the way we interact with technology on a daily basis.

Collaborations: Throughout his career, Kenichi Suematsu has collaborated with top researchers, engineers, and scientists, fostering a culture of innovation and excellence in all his projects. His collaborative efforts have led to the development of cutting-edge technologies that have had a lasting impact on society.

Conclusion: Kenichi Suematsu's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and engineers worldwide. His contributions to the field of technology have solidified his legacy as a true pioneer in the industry.

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