Kazunori Imamura

This inventor holds 13 USPTO granted patents. Top assignees: Nippon Kogaku K.k., Nikon Corporation. Active years: 1984-1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kazunori Imamura. Retrieved from https://idiyas.com/inventor/kazunori-imamura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 13

% Patents Active = 100.0

Average Co-Inventor Count = 2.1

ph-index = 10

Forward Citations = 463(Granted Patents)

Company Filing History:

Years Active: 1984-1991

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13 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 4999510 - Apparatus for detecting foreign particles on a surface of a reticle or (1991-03-12),

2. 4966457 - Inspecting apparatus for determining presence and location of foreign (1990-10-30),

3. 4908517 - Apparatus for examining the surface of a substrate (1990-03-13),

4. 4889998 - Apparatus with four light detectors for checking surface of mask with (1989-12-26),

5. 4833051 - Protective device for photographic masks (1989-05-23),

6. 4803373 - Conveyor arm apparatus with gap detection (1989-02-07),

7. 4776693 - Foreign substance inspecting system including a calibration standard (1988-10-11),

8. 4715392 - Automatic photomask or reticle washing and cleaning system (1987-12-29),

9. 4690528 - Projection exposure apparatus (1987-09-01),

10. 4666292 - Projection optical apparatus and a photographic mask therefor (1987-05-19),

11. 4610541 - Foreign substance inspecting apparatus (1986-09-09),

12. 4568835 - Apparatus for detecting foreign matters on a planar substrate (1986-02-04),

13. 4468120 - Foreign substance inspecting apparatus (1984-08-28),

Title: **The Innovations of Kazunori Imamura: A Pioneer in Foreign Particle Detection**

Introduction

Kazunori Imamura is a distinguished inventor hailing from Tokyo, Japan, celebrated for his innovative contributions to the field of optical inspection technology. With a remarkable portfolio comprising 13 patents, Imamura has made significant advancements in identifying foreign particles on essential surfaces utilized in various industries.

Latest Patents

Imamura's latest inventions showcase his expertise in detecting impurities that can compromise product quality. One notable patent is for an apparatus designed to detect foreign particles on the surface of a reticle or pellicle. This apparatus employs an optical system that directs a light beam to create a light spot that scans the surface. As the surface and the light spot are relatively shifted, light detectors collect scattered light from foreign particles and generate photoelectric outputs, allowing for effective discrimination of the particles' presence. Additionally, he has developed an inspecting apparatus for determining the presence and location of defect elements on thin, light-transmitting objects. By applying two light beams of different wavelengths while varying their incident angles, this invention accurately identifies adhered defects through sophisticated photoelectric detection methods.

Career Highlights

Throughout his career, Kazunori Imamura has played a pivotal role in renowned companies such as Nippon Kogaku K.K. and Nikon Corporation. His dedicated work in these prominent organizations has significantly impacted the advancement of optical technologies, particularly in fields requiring meticulous inspection processes.

Collaborations

Imamura has worked alongside notable colleagues, including Akikazu Tanimoto and Fuminori Hayano. Their combined efforts in research and development have led to innovative solutions aimed at enhancing optical inspection capabilities, reflecting the collaborative spirit of scientific and technological advancement.

Conclusion

Kazunori Imamura's contributions to the field of foreign particle detection have established him as a leading inventor in optical technology. His patents not only demonstrate his ingenuity but also his commitment to improving quality control in various industries. As technology continues to evolve, Imamura's innovations will undoubtedly remain influential in shaping the future of optical inspection.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]