The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 1991
Filed:
Oct. 27, 1989
Fuminori Hayano, Fujisawa, JP;
Kazunori Imamura, Tokyo, JP;
Sunao Murata, Kawasaki, JP;
Kinya Kato, Tokyo, JP;
Nikon Corporation, Tokyo, JP;
Abstract
An apparatus for detecting foreign particles on a surface of a reticle or pellicle comprises an optical system through which a light beam forms a light spot on the surface. The surface and the light spot are shifted relatively so that the light spot scans the surface. Light detectors receive light scattered by a foreign particle and directed in different directions, respectively, and generated photoelectric outputs by which the presence of the foreign particle is discriminated. Beam diameter and scanning speed are varied to provide the most effective operation for particles of different sizes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile