Tokyo, Japan

Fuminori Hayano

This inventor holds 21 USPTO granted patents and 2 published patent applications and 3 EPO patents. Top assignee: Nikon Corporation. Active years: 1989-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fuminori Hayano. Retrieved from https://idiyas.com/inventor/fuminori-hayano

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 21 

% Patents Active = 95.2

 

Average Co-Inventor Count = 2.0

ph-index = 10

Forward Citations = 376(Granted Patents)


Location History:

  • Kamakura, JP (1990)
  • Fujisawa, JP (1989 - 1991)
  • Yokohama, JP (1991 - 1994)
  • Phoenix, AZ (US) (2007)
  • Tokyo, JP (1995 - 2021)

Company Filing History:


Years Active: 1989-2021

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21 patents (USPTO):Explore Patents

Title: Insights into Fuminori Hayano and His Innovations

Introduction

Fuminori Hayano is a prominent inventor based in Tokyo, Japan, known for his significant contributions to the field of measurement processing technology. With a remarkable portfolio of 21 patents to his name, Hayano has made strides in developing innovative solutions that enhance the capability of measurement devices, particularly in x-ray inspection applications.

Latest Patents

Among his latest inventions, Hayano has developed a series of patents that include a measurement processing device, measurement processing method, measurement processing program, and a method for manufacturing structure. These innovations are particularly notable for their application in x-ray inspection apparatuses. The measurement processing device is designed to detect x-ray transmissions through specimens using a detection unit, capable of sequentially inspecting multiple specimens based on the acquired transmission images. Key features of this device include:

- A setting unit that designates the region of inspection on the specimen.

- A determination unit that assesses the non-defectiveness of the inspected region through the analysis of transmission images.

- A correction unit that modifies the inspected region based on the determination results.

- A display control unit that visualizes the corrected inspection area for users.

Career Highlights

Hayano's career has been marked by his tenure at Nikon Corporation, where he has had the opportunity to innovate and contribute significantly to the company's technological advancements in imaging and measurement systems. His work not only enhances the company's portfolio but also impacts the broader field of x-ray technology.

Collaborations

Throughout his career, Fuminori Hayano has worked closely with talented individuals, among whom are Akitoshi Kawai and Kazunori Imamura. These collaborations have facilitated the sharing of ideas and the development of cutting-edge technologies that push the boundaries of measurement processing.

Conclusion

Fuminori Hayano's contributions to the field of measurement processing technology exemplify the impact that inventive minds can have on industry advancements. With numerous patents and a collaborative spirit, Hayano continues to drive innovation at Nikon Corporation and beyond. His work not only enhances x-ray inspection capabilities but also inspires future innovations in the measurement domain.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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