The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 1984

Filed:

Jan. 28, 1982
Applicant:
Inventors:

Akikazu Tanimoto, Kawasaki, JP;

Kazunori Imamura, Tokyo, JP;

Assignee:

Nippon Kogaku K.K., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356237 ; 250563 ; 250572 ; 356239 ;
Abstract

An apparatus for detecting the presence of a foreign substance adhering to a planar substrate comprises irradiating means capable of emitting a light beam incident on one surface of the substrate obliquely relative to the surface, means for displacing the irradiating means and the substrate relative to each other so that the position of incidence of the light beam onto the substrate is scanned on said one surface, metering means capable of receiving a plurality of irregular reflected light beams of the light beam which have been irregularly reflected on said surface toward different directions and producing a plurality of electrical outputs corresponding to the intensity of light of the plurality of irregular reflected light beams, and means for deciding the presence of the foreign substance on the basis of the plurality of electrical outputs.


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