The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 13, 1990

Filed:

Jul. 29, 1988
Applicant:
Inventor:

Kazunori Imamura, Tokyo, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250563 ; 250236 ; 250572 ; 356430 ;
Abstract

An apparatus for examining the surface of a substrate comprises irradiating means for supplying a light beam which scans the surface of the substrate, first and second light-receiving means for individually receiving scattered lights travelling in different first and second directions from the surface of the substrate and individually producing first and second output signals conforming to the intensities of the received lights, and means for discriminating the directional characteristics of the scattered lights on the basis of the time phase shift between the first and second output signals.


Find Patent Forward Citations

Imamura, Kazunori. (1990). Apparatus for examining the surface of a substrate (U.S. Patent No. 4908517). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4908517

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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