This inventor holds 14 USPTO granted patents, primarily in Pattern Inspection Technology. Top assignees: Nuflare Technology, Inc., Fujitsu Corporation, Kabushiki Kaisha Toshiba. Active years: 2002-2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Yokohama, JP (2009)
- Fukuoka, JP (2002 - 2010)
- Kanagawa, JP (2017)
- Kawasaki, JP (2005 - 2021)
Company Filing History:
6 out of 749 
5 out of 39,381 
3 out of 53,315 
Years Active: 2002-2021
Areas of Expertise:
Title: Kazuhiro Nakashima: Innovator in Pattern Inspection Technology
Introduction
Kazuhiro Nakashima is a prominent inventor based in Kawasaki, Japan. He has made significant contributions to the field of pattern inspection technology, holding a total of 14 patents. His work has been instrumental in advancing the capabilities of optical and charged particle beam imaging systems.
Latest Patents
Among his latest patents is a pattern inspection apparatus and method. This innovative apparatus includes an optical image acquisition mechanism that captures optical image data from various regions of a substrate with multiple figure patterns. It features several comparison circuits that perform die-to-die and die-to-database inspection processing. The inspection circuit outputs optical image data for each region to the comparison circuits, which can be variably set for each region. Another notable patent is the multi-charged particle beam image acquisition apparatus. This device includes an image acquisition mechanism that utilizes multiple charged particle beams to scan a target object, acquiring image data while averaging errors through superimposition.
Career Highlights
Kazuhiro Nakashima has worked with notable companies such as Nuflare Technology, Inc. and Fujitsu Corporation. His experience in these organizations has allowed him to develop and refine his innovative technologies, contributing to the advancement of the industry.
Collaborations
Some of his coworkers include Hideo Tsuchiya and Shinji Sugihara. Their collaboration has likely played a role in the successful development of various projects and patents.
Conclusion
Kazuhiro Nakashima's contributions to pattern inspection technology have established him as a key figure in the field. His innovative patents and career achievements reflect his dedication to advancing imaging technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile