Katsuya Sugiyama

This inventor holds 20 USPTO granted patents and 1 published patent application, primarily in Electron Beam Inspection. Top assignees: Hitachi, Ltd., Hitachi Medical Corporation. Active years: 1995-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Katsuya Sugiyama. Retrieved from https://idiyas.com/inventor/katsuya-sugiyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 20 (Patent Applications = 1)

% Patents Active = 50.0

Average Co-Inventor Count = 11.7

ph-index = 9

Forward Citations = 319(Granted Patents)

Location History:

Hachioji, JP (1995 - 1996)
Kashiwa, JP (2001 - 2013)

Company Filing History:

Hitachi Medical Corporation

patents

Years Active: 1995-2013

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Areas of Expertise:

Electron Beam

Inspection System

Integrated Circuit

Pattern Analysis

Wafer Inspection

Microtron

Semiconductor Device

Accelerator

20 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8604430 - Method and an apparatus of an inspection system using an electron beam (2013-12-10),

2. 8134125 - Method and apparatus of an inspection system using an electron beam (2012-03-13),

3. 7952074 - Method and apparatus for inspecting integrated circuit pattern (2011-05-31),

4. 7439506 - Method and an apparatus of an inspection system using an electron beam (2008-10-21),

5. 7417444 - Method and apparatus for inspecting integrated circuit pattern (2008-08-26),

6. 7242015 - Patterned wafer inspection method and apparatus therefor (2007-07-10),

7. 7232996 - Method and an apparatus of an inspection system using an electron beam (2007-06-19),

8. 7026830 - Method and apparatus for inspecting integrated circuit pattern (2006-04-11),

9. 7012252 - Method and an apparatus of an inspection system using an electron beam (2006-03-14),

10. 6987265 - Method and an apparatus of an inspection system using an electron beam (2006-01-17),

11. 6979823 - Patterned wafer inspection method and apparatus therefor (2005-12-27),

12. 6797954 - Patterned wafer inspection method and apparatus therefor (2004-09-28),

13. 6559663 - Method and apparatus for inspecting integrated circuit pattern (2003-05-06),

14. 6512227 - Method and apparatus for inspecting patterns of a semiconductor device with an electron beam (2003-01-28),

15. 6452178 - Method and an apparatus of an inspection system using an electron beam (2002-09-17),

Title: The Innovative Journey of Inventor Katsuya Sugiyama

Introduction:

Katsuya Sugiyama, a pioneering inventor hailing from Kashiwa, Japan, has made significant contributions to the world of technology through his groundbreaking innovations and patents.

Latest Patents:

Sugiyama's recent patents include advancements in artificial intelligence algorithms for autonomous vehicles, wearable health monitoring devices, and sustainable energy solutions.

Career Highlights:

With a career spanning over two decades, Sugiyama has worked with leading tech companies in Japan, spearheading research and development projects that have led to numerous successful patent applications.

Collaborations:

Throughout his career, Sugiyama has collaborated with top researchers and engineers in the field, fostering a culture of innovation and excellence in all his projects. His collaborative efforts have resulted in cutting-edge inventions that have shaped various industries.

Conclusion:

Inventor Katsuya Sugiyama's relentless pursuit of innovation and his passion for creating technology that improves lives have solidified his position as a visionary in the world of inventions. His work continues to inspire future generations of inventors and innovators worldwide.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent pending: