Katsuhiro Sasada

This inventor holds 23 USPTO granted patents. Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd., Hitachi-Science Systems, Ltd.. Active years: 1997-2019.

USPTO Granted Patents = 23

% Patents Active = 82.6

Average Co-Inventor Count = 4.1

ph-index = 4

Forward Citations = 90(Granted Patents)

Location History:

Katsuta, JP (1997)
Hitachinaka, JP (1997 - 2017)
Tokyo, JP (2019)

Company Filing History:

21 out of 2,874

Hitachi-High-Technologies Corporation

Hitachi-Science Systems, Ltd.

patents

where one patent can have more than one assignee

Years Active: 1997-2019

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23 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 10393509 - Pattern height measurement device and charged particle beam device (2019-08-27),

2. 10184790 - Pattern measurement method and pattern measurement device (2019-01-22),

3. 9671223 - Pattern dimension measurement method using electron microscope, pattern dimension measurement system, and method for monitoring changes in electron microscope equipment over time (2017-06-06),

4. 8362426 - Scanning electron microscope and image signal processing method (2013-01-29),

5. 8203504 - Image forming method and charged particle beam apparatus (2012-06-19),

6. 8188427 - Scanning electron microscope alignment method and scanning electron microscope (2012-05-29),

7. 8178836 - Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope (2012-05-15),

8. 8071961 - Charged particle beam apparatus (2011-12-06),

9. 7817105 - Image forming method and charged particle beam apparatus (2010-10-19),

10. 7745782 - Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope (2010-06-29),

11. 7626166 - Electron microscope (2009-12-01),

12. 7601974 - Charged particle beam apparatus (2009-10-13),

13. 7566892 - Electron beam apparatus and method for production of its specimen chamber (2009-07-28),

14. 7514683 - Scanning electron microscope (2009-04-07),

15. 7435958 - Electron beam apparatus and method for production of its specimen chamber (2008-10-14),

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