For the Inventor, By the Inventor

Enter inventor name

Arlington, MA, United States of America

Karen E Walrath

This inventor holds 14 USPTO granted patents and 1 EPO patent. Top assignee: Jentek Sensors, Incorporated. Active years: 2002-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Karen E Walrath. Retrieved from https://idiyas.com/inventor/karen-e-walrath

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 14

% Patents Active = 71.4

EPO Patents = 1 (Patent Applications = 1)

Average Co-Inventor Count = 6.0

ph-index = 9

Forward Citations = 198(Granted Patents)

Location History:

Arlington, MA (US) (2002 - 2013)
Waltham, MA (US) (2020)

Company Filing History:

Jentek Sensors, Incorporated

Years Active: 2002-2020

Loading Chart...

Loading Chart...

14 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 10677756 - Integrated sensor cartridge system and method of use (2020-06-09),

2. 8415947 - Method for stress assessment that removes temperature effects and hysteresis on the material property measurements (2013-04-09),

3. 8222897 - Test circuit with sense elements having associated and unassociated primary windings (2012-07-17),

4. 7994781 - Eddy current sensor with concentric segments (2011-08-09),

5. 7589526 - Surface mounted sensor arrays having segmented primary windings (2009-09-15),

6. 7451657 - Material condition monitoring with multiple sensing modes (2008-11-18),

7. 7348771 - Method for verifying sensor condition (2008-03-25),

8. 7230421 - Damage standard fabrication with attached sensor (2007-06-12),

9. 7161350 - Method for material property monitoring with perforated, surface mounted sensors (2007-01-09),

10. 7049811 - Test circuit having parallel drive segments and a plurality of sense elements (2006-05-23),

11. 6798198 - Fluid supports for sensors (2004-09-28),

12. 6784662 - Eddy current sensor arrays having drive windings with extended portions (2004-08-31),

13. 6420867 - Method of detecting widespread fatigue and cracks in a metal structure (2002-07-16),

14. 6377039 - Method for characterizing coating and substrates (2002-04-23),

Dear client, I understand that you are interested in learning more about the accomplished inventor Karen E Walrath. Below you will find an article that details her achievements and contributions in the field of innovation:

Title: The Innovative Journey of Karen E Walrath

Introduction:

Karen E Walrath is a pioneering inventor based in Arlington, MA, USA, who has made significant strides in the development of advanced sensor systems and stress assessment technologies.

Latest Patents:

With an impressive portfolio of 14 patents, Karen E Walrath's latest inventions include an Integrated sensor cartridge system and a Method for stress assessment that removes temperature effects and hysteresis on material property measurements. These inventions demonstrate her expertise in creating innovative solutions for material testing and measurement.

Career Highlights:

Karen E Walrath is associated with Jentek Sensors, Incorporated, a company at the forefront of sensor technology development. Her work at Jentek Sensors has been instrumental in advancing the field of sensor systems and nondestructive measurement techniques.

Collaborations:

Karen E Walrath has collaborated with talented individuals in her field, including coworkers Neil J Goldfine and Darrell E Schlicker. Together, they have worked towards pushing the boundaries of innovation and creating groundbreaking technologies.

Conclusion:

In conclusion, Karen E Walrath's passion for innovation and dedication to her craft have led to the development of cutting-edge sensor systems and material assessment methods. Her contributions continue to drive advancements in the field, making her a respected figure in the world of inventors and patent holders.

If you have any more specific requests or need further information, feel free to let me know!

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…