The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2004
Filed:
Mar. 19, 2002
Darrell E. Schlicker, Watertown, MA (US);
Neil J. Goldfine, Newton, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Karen E. Walrath, Arlington, MA (US);
Ian C. Shay, Cambridge, MA (US);
David C. Grundy, Reading, MA (US);
Mark Windoloski, Burlington, MA (US);
Jentek Sensors, Inc., Waltham, MA (US);
Abstract
An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.