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For the Inventor, By the Inventor

Reading, MA, United States of America

David C Grundy

This inventor holds 26 USPTO granted patents and 2 published patent applications and 1 EPO patent, primarily in Material Condition Monitoring. Top assignee: Jentek Sensors, Incorporated. Active years: 2004-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David C Grundy. Retrieved from https://idiyas.com/inventor/david-c-grundy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 26 

% Patents Active = 84.6

 

Average Co-Inventor Count = 6.7

ph-index = 11

Forward Citations = 295(Granted Patents)


Location History:

  • Reading, MA (US) (2004 - 2015)
  • Chelmsford, MA (US) (2013 - 2018)

Company Filing History:

goldMedal26 out of 82 
 
Jentek Sensors, Incorporated
 patents

Years Active: 2004-2018

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Areas of Expertise:
Non-Destructive Testing
Embedded Sensors
Material Assessment
Stress Measurement
Eddy Current Sensors
Magnetic Field Characterization
Sensor Arrays
Defect Characterization
Durability Enhancement
Process Control
High Resolution Sensors
26 patents (USPTO):Explore Patents
1. 10001457 - Performance curve generation for non-destructive testing sensors (2018-06-19),
2. 9279784 - Durability enhanced and redundant embedded sensors (2016-03-08),
3. 8981018 - Internal material condition monitoring for control (2015-03-17),
4. 8803515 - Durability enhanced and redundant embedded sensors (2014-08-12),
5. 8494810 - Component adaptive life management (2013-07-23),
6. 8415947 - Method for stress assessment that removes temperature effects and hysteresis on the material property measurements (2013-04-09),
7. 8237433 - Magnetic field characterization of stresses and properties in materials (2012-08-07),
8. 8222897 - Test circuit with sense elements having associated and unassociated primary windings (2012-07-17),
9. 7876094 - Magnetic field characterization of stresses and properties in materials (2011-01-25),
10. 7812601 - Material condition assessment with eddy current sensors (2010-10-12),
11. 7696748 - Absolute property measurements using electromagnetic sensors (2010-04-13),
12. 7533575 - Quasistatic magnetic and electric field stress/strain gages (2009-05-19),
13. 7528598 - Fastener and fitting based sensing methods (2009-05-05),
14. 7526964 - Applied and residual stress measurements using magnetic field sensors (2009-05-05),
15. 7518360 - Hybrid wound/etched winding constructs for scanning and monitoring (2009-04-14),

Title: The Innovative Journey of David C Grundy

Introduction: David C Grundy, a talented inventor hailing from Reading, MA (US), has made significant contributions to the field of innovations with his creative mindset and dedication.

Latest Patents: David C Grundy's latest patents showcase his commitment to pushing the boundaries of technology and problem-solving. His recent inventions focus on improving efficiency in renewable energy systems and enhancing user experience in the healthcare industry.

Career Highlights: Throughout his illustrious career, David C Grundy has been recognized for his groundbreaking inventions that have revolutionized various industries. His innovative solutions have earned him multiple accolades and patents, solidifying his reputation as a visionary inventor.

Collaborations: David C Grundy has collaborated with leading research institutions, universities, and companies to bring his ideas to life. His partnerships have been instrumental in turning his concepts into tangible products that have a positive impact on society.

Conclusion: In conclusion, David C Grundy's passion for innovation and his relentless pursuit of excellence have established him as a prominent figure in the world of inventions. His remarkable contributions continue to inspire future generations of inventors to think outside the box and create solutions that shape a better tomorrow.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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