The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2013
Filed:
Jun. 07, 2010
Neil J. Goldfine, Newton, MA (US);
Yanko K. Sheiretov, Waltham, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
David C. Grundy, Chelmsford, MA (US);
Robert J. Lyons, Bostn, MA (US);
David A. Jablonski, Whitman, MA (US);
Floyd W. Spencer, Albuquerque, NM (US);
Neil J. Goldfine, Newton, MA (US);
Yanko K. Sheiretov, Waltham, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
David C. Grundy, Chelmsford, MA (US);
Robert J. Lyons, Bostn, MA (US);
David A. Jablonski, Whitman, MA (US);
Floyd W. Spencer, Albuquerque, NM (US);
Jentek Sensors, Inc., Waltham, MA (US);
Abstract
A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired. A hyperlattice database is used with a rapid searching method to estimate at least one material condition and one usage parameter, such as stress level for the component. The hyperlattice is also used to rapidly predict future condition, associated uncertainty and risk of failure.