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For the Inventor, By the Inventor

Waltham, MA, United States of America

Jentek Sensors, Incorporated


USPTO Granted Patents = 81



Trademarks = 6

Forward Citations = 885

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44 inventors (with patents filed for the assignee):

goldMedal Neil J Goldfine (81 out of 89 patents)

silverMedal Andrew P Washabaugh (50 out of 50 patents)

bronzeMedal Darrell E Schlicker (45 out of 45 patents)

4.  David C Grundy (26 out of 26 patents)

5.  Yanko K Sheiretov (25 out of 26 patents)

6.  Vladimir A Zilberstein (23 out of 23 patents)

7.  Todd M Dunford (21 out of 23 patents)

8.  Ian C Shay (16 out of 16 patents)

9.  Scott A Denenberg (14 out of 53 patents)

10.  Karen E Walrath (14 out of 14 patents)

11.  Robert J Lyons (12 out of 12 patents)

12.  Mark D Windoloski (11 out of 11 patents)

13.  Vladimir B Tsukernik (10 out of 19 patents)

14.  Volker Weiss (9 out of 9 patents)

15.  Stuart D Chaplan (7 out of 8 patents)


81 patents:

1. 12461068 - System and method for hole inspection and qualification (2025-11-04),
2. 12359945 - Measurement system and method of use (2025-07-15),
3. 12332201 - System and method for pit detection and sizing (2025-06-17),
4. 12253492 - In-process quality assessment for additive manufacturing (2025-03-18),
5. 12061169 - System and method for hole inspection (2024-08-13),
6. 11959880 - Method and apparatus for measurement of material condition (2024-04-16),
7. 11841245 - Measurement system and method of use (2023-12-12),
8. 11802851 - Segmented field eddy current sensing for dispersive property measurement and complex structures (2023-10-31),
9. 11747304 - In-process quality assessment for additive manufacturing (2023-09-05),
10. 11549831 - Measurement system and method of use (2023-01-10),
11. 11543388 - In-process quality assessment for additive manufacturing (2023-01-03),
12. 11435317 - Complex part inspection with eddy current sensors (2022-09-06),
13. 11268933 - In-process quality assessment for additive manufacturing (2022-03-08),
14. 11268931 - Segmented field eddy current sensing for dispersive property measurement and complex structures (2022-03-08),
15. 11092571 - Method and apparatus for measurement of material condition (2021-08-17),
Jentek Sensors, Incorporated is a leading technology company specializing in sensor solutions for various industries. With over 25 years of experience, Jentek Sensors delivers cutting-edge sensing technologies that help businesses optimize operations and enhance product performance. Their wide range of sensors includes pressure sensors, temperature sensors, humidity sensors, and more. Jentek Sensors is committed to delivering reliable and innovative sensor solutions to meet the evolving needs of their clients.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 2 2025

81 Patents

#13 in Waltham, MA

#242 in Massachusetts

#4,392 in US

#8,976 in the World

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Waltham, MA, United States of America

Jentek Sensors, Incorporated

Forward Citations = 885

44 inventors:

goldMedal Neil J Goldfine (81 out of 89 patents)

silverMedal Andrew P Washabaugh (50 out of 50 patents)

bronzeMedal Darrell E Schlicker (45 out of 45 patents)

4.  David C Grundy (26 out of 26 patents)

5.  Yanko K Sheiretov (25 out of 26 patents)

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