The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

May. 09, 2022
Applicant:

Jentek Sensors, Inc., Marlborough, MA (US);

Inventors:

Neil J. Goldfine, Cocoa Beach, FL (US);

Andrew P. Washabaugh, Chula Vista, CA (US);

Mark Windoloski, Chelmsford, MA (US);

Assignee:

JENTEK Sensors, Inc., Marlborough, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01H 13/00 (2006.01); G01B 11/12 (2006.01); G01B 11/22 (2006.01); G01N 27/02 (2006.01); G01N 29/12 (2006.01);
U.S. Cl.
CPC ...
G01N 27/028 (2013.01); G06T 2207/30136 (2013.01);
Abstract

A system and method are disclosed for enhancing pit detection and sizing in a test object. Response signatures are created and stored in a signature library to characterize various sensor responses (liftoff, orientation) and pit properties (e.g., depth, width), possibly with or without additional considerations (e.g., edges, cracks). A sensor is placed on and scanned across a surface of interest on the test object. During scanning the sensor is measured repeatedly at regular intervals. An encoder may be used to record the sensor position for each measurement. The measurement results are then correlated with one or more signatures in the signature library. A threshold is used to determine if the correlation is indicative of the detection of a pit. If so additional processing may be performed to estimate pit properties.


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