The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Mar. 14, 2005
Neil J. Goldfine, Newton, MA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
Ian C. Shay, Waltham, MA (US);
Christopher A. Craven, Bedford, MA (US);
David C. Grundy, Reading, MA (US);
Volker Weiss, Syracuse, NY (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Neil J. Goldfine, Newton, MA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
Ian C. Shay, Waltham, MA (US);
Christopher A. Craven, Bedford, MA (US);
David C. Grundy, Reading, MA (US);
Volker Weiss, Syracuse, NY (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Jentek Sensors, Inc., Waltham, MA (US);
Abstract
The condition of internal or hidden material layers or interfaces is monitored and used for control of a process that changes a condition of a material system. The material system has multiple component materials, such as layers or embedded constituents, or can be represented with multiple layers to model spatial distributions in the material properties. The material condition changes as a result of a process performed on the material, such as by cold working, or from functional operation. Sensors placed proximate to the test material surface or embedded between material layers are used to monitor a material property using magnetic, electric, or thermal interrogation fields. The sensor responses are converted into states of the material condition, such as temperature or residual stress, typically with a precomputed database of sensor responses. The sensor responses can also be used to determine properties of the test material, such as electrical conductivity or magnetic permeability, prior to conversion to the material state. The states are used to support control decisions that control the process or operation causing the material condition to change.