The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Apr. 19, 2012
Neil J. Goldfine, Newton, MA (US);
Yanko K. Sheiretov, Waltham, MA (US);
Floyd W. Spencer, Albuquerque, NM (US);
David A. Jablonski, Whitman, MA (US);
David C. Grundy, Chelmsford, MA (US);
Darrell E. Schlicker, Freeland, MI (US);
Neil J. Goldfine, Newton, MA (US);
Yanko K. Sheiretov, Waltham, MA (US);
Floyd W. Spencer, Albuquerque, NM (US);
David A. Jablonski, Whitman, MA (US);
David C. Grundy, Chelmsford, MA (US);
Darrell E. Schlicker, Freeland, MI (US);
JENTEK SENSORS, INC., Waltham, MA (US);
Abstract
Methods and apparatus for enhancing performance curve generation, damage monitoring, and improving non-destructive testing performance. Damage standards used for performance curve generation are monitored using a non-destructive testing (NDT) sensor during a damage evolution test performed with the standard. The evolution test may be intermittently paused to permit ground truth data to be collected in addition to the NDT sensor data. A damage evolution model may be used to estimate ground truth data during the intervening periods of the damage evolution test. The NDT sensor data and ground truth data are used to generate performance curves for the NDT system. Multiple sensors may be monitored at multiple locations on the damage standard and multiple damage evolution tests may be performed with multiple damage standards.