The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2012
Filed:
Jan. 19, 2011
Neil J. Goldfine, Newton, MA (US);
Ian C. Shay, Cambridge, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
David C. Grundy, Reading, MA (US);
Robert J. Lyons, Boston, MA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
Neil J. Goldfine, Newton, MA (US);
Ian C. Shay, Cambridge, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
David C. Grundy, Reading, MA (US);
Robert J. Lyons, Boston, MA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
Jentek Sensors, Inc., Waltham, MA (US);
Abstract
Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.