The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Oct. 12, 2004
Darrell E. Schlicker, Watertown, MA (US);
Neil J. Goldfine, Newton, MA (US);
David C. Grundy, Reading, MA (US);
Robert J. Lyons, Boston, MA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Vladimir Tsukernik, West Roxbury, MA (US);
Mark D. Windoloski, Burlington, MA (US);
Ian C. Shay, Waltham, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Neil J. Goldfine, Newton, MA (US);
David C. Grundy, Reading, MA (US);
Robert J. Lyons, Boston, MA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Vladimir Tsukernik, West Roxbury, MA (US);
Mark D. Windoloski, Burlington, MA (US);
Ian C. Shay, Waltham, MA (US);
Jentek Sensors, Inc., Waltham, MA (US);
Abstract
Methods and apparatus are described for absolute electrical property measurement of materials. This is accomplished with magnetic and electric field based sensors and sensor array geometries that can be modeled accurately and with impedance instrumentation that permits accurate measurements of the in-phase and quadrature phase signal components. A dithering calibration method is also described which allows the measurement to account for background material noise variations. Methods are also described for accounting for noise factors in sensor design and selection of the optimal operating conditions which can minimize the error bounds for material property estimates. Example application of these methods to automated engine disk slot inspection and assessment of the mechanical condition of dielectric materials are presented.