The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2006
Filed:
Jun. 23, 2004
Darrell E. Schlicker, Watertown, MA (US);
Neil J. Goldfine, Newtown, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Karen E. Walrath, Arlington, MA (US);
Ian C. Shay, Cambridge, MA (US);
David C. Grundy, Reading, MA (US);
Mark Windoloski, Burlington, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Neil J. Goldfine, Newtown, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Karen E. Walrath, Arlington, MA (US);
Ian C. Shay, Cambridge, MA (US);
David C. Grundy, Reading, MA (US);
Mark Windoloski, Burlington, MA (US);
JENTEK Sensors, Inc., Waltham, MA (US);
Abstract
A test circuit having a drive winding with parallel conducting segments and a plurality of sense elements used for the nondestructive measurement of materials. The drive winding segments have extended portions and are driven by a time varying electric current to impose a magnetic field in the test material. Sense elements are distributed in a direction parallel to the extended portions of these drive segments, with separate connections provided to each sense element. A second plurality of sense elements may also be distributed parallel to the extended portions of the drive windings, being either aligned or offset from a first plurality of sense elements.