The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2002

Filed:

Mar. 13, 1998
Applicant:
Inventors:

Neil J. Goldfine, Newton, MA (US);

David C. Clark, Arlington, MA (US);

Karen E. Walrath, Arlington, MA (US);

Volker Weiss, Syracuse, NY (US);

William M. Chepolis, Bedford, MA (US);

Assignee:

Jentek Sensors, Inc., Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/782 ; G01R 3/312 ;
U.S. Cl.
CPC ...
G01N 2/782 ; G01R 3/312 ;
Abstract

An apparatus and a method of detecting wide spread fatigue damage (WFD) on aircraft using the absolute conductivity of the metal. A meandering winding magnetometer (MWM) having a plurality of parallel spaced linear conductor elements are placed in proximity to the aircraft. An electromagnetic field is imposed on the aircraft and the resulting response is sensed. The response is transformed to determine the conductivity of the aircraft structure. The mapping of the conductivity of the aircraft structure produces an indication where microcracks are located in the structure. These early indications of the density, spatial distribution and spatial orientation, as well as the size, of the microcracks give the user an indication of WFD.


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