Location History:
- Bedford, MA (US) (2002)
- Viero, FL (US) (2007)
Company Filing History:
Years Active: 2002-2007
Title: Innovations of William M Chepolis
Introduction
William M Chepolis is an accomplished inventor based in Viera, FL (US). He holds 2 patents that showcase his expertise in material property monitoring and structural integrity assessment. His work has significant implications for industries that rely on the durability and safety of materials, particularly in aerospace applications.
Latest Patents
One of his latest patents is titled "Method for material property monitoring with perforated, surface mounted sensors." This innovation involves the use of electromagnetic sensors and sensor arrays that are mounted on the surface of materials. These sensors are designed to be thin and flexible, allowing them to conform to the test material without altering its environmental exposure conditions. The periodic winding or electrode structure of the sensors creates a sensing field when activated by an electrical signal.
Another notable patent is the "Method of detecting widespread fatigue and cracks in a metal structure." This invention provides a method for detecting widespread fatigue damage (WFD) in aircraft by measuring the absolute conductivity of the metal. A meandering winding magnetometer (MWM) is utilized, which consists of parallel spaced linear conductor elements placed near the aircraft. An electromagnetic field is applied, and the response is analyzed to determine the conductivity of the aircraft structure. This mapping helps identify microcracks, providing early indications of potential structural issues.
Career Highlights
William M Chepolis is currently associated with Jentek Sensors, Incorporated, where he applies his innovative ideas to develop advanced sensor technologies. His contributions to the field of material monitoring and structural integrity have positioned him as a key figure in the industry.
Collaborations
Throughout his career, Chepolis has collaborated with notable professionals, including Neil J Goldfine and David C Clark. These partnerships have further enhanced his research and development efforts, leading to impactful innovations.
Conclusion
William M Chepolis is a significant contributor to the field of material property monitoring and structural integrity assessment. His patents reflect his commitment to advancing technology in these critical areas. His work continues to influence the safety and reliability of materials used in various industries.