The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2008
Filed:
Sep. 18, 2006
Neil J. Goldfine, Newton, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Karen E. Walrath, Arlington, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
Vladimir Tsukemik, West Roxbury, MA (US);
Neil J. Goldfine, Newton, MA (US);
Darrell E. Schlicker, Watertown, MA (US);
Karen E. Walrath, Arlington, MA (US);
Andrew P. Washabaugh, Chula Vista, CA (US);
Vladimir A. Zilberstein, Chestnut Hill, MA (US);
Vladimir Tsukemik, West Roxbury, MA (US);
JENTEK Sensors, Inc., Waltham, MA (US);
Abstract
Sensor condition verification may be performed on electromagnetic sensors and sensor arrays mounted to a material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. Monitoring the conductivity changes of a test material, with changes in temperature, may provide a mechanism for testing the integrity of the sensor. Changes in the conductivity, due to changes in temperature, without significant lift-off changes may verify the calibration of the sensor and that the sensor elements themselves are intact.