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For the Inventor, By the Inventor

Eindhoven, Netherlands

Karel D Van Der Mast

This inventor holds 19 USPTO granted patents and 1 published patent application. Top assignees: U.S. Philips Corporation, Phenom-World Holding B.v., Fei Comapny. Active years: 1978-2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Karel D Van Der Mast. Retrieved from https://idiyas.com/inventor/karel-d-van-der-mast

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 19 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 8

Forward Citations = 230(Granted Patents)


Location History:

  • Pynacker, NL (1986)
  • Pijnacker, NL (1988 - 1991)
  • Eindhoven, NL (1978 - 2021)

Company Filing History:

goldMedal15 out of 14,087 
 
U.S. Philips Corporation
 patents
silverMedal2 out of 2 
 
Phenom-World Holding B.v.
 patents
bronzeMedal1 out of 862 
 
Fei Comapny
 patents
4. 1 out of 834,513 
Other
 patents

Years Active: 1978-2021

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19 patents (USPTO):Explore Patents
1. 11024481 - Scanning electron microscope (2021-06-01),
2. 10796879 - Scanning electron microscope (2020-10-06),
3. 10580613 - Sample stage (2020-03-03),
4. 5986269 - Correction device for correcting chromatic aberration in (1999-11-16),
5. 5578822 - Particle-optical apparatus comprising a detector for secondary electrons (1996-11-26),
6. 5336885 - Electron beam apparatus (1994-08-09),
7. 5300775 - Method of selecting a spatial energy spread within an electron beam, and (1994-04-05),
8. 5221844 - Charged particle beam device (1993-06-22),
9. 5001349 - Charged-particle beam apparatus (1991-03-19),
10. 4977324 - Charged particle beam apparatus (1990-12-11),
11. 4902930 - Electron image projector (1990-02-20),
12. 4871911 - Electron beam apparatus comprising a semiconductor electron emitter (1989-10-03),
13. 4823013 - Charged particles exposure apparatus having an optically deformable beam (1989-04-18),
14. 4820921 - Method of beam centering (1989-04-11),
15. 4789780 - Apparatus for energy-selective visualization (1988-12-06),

Title: The Innovative Journey of Karel D Van Der Mast

Introduction

Karel D Van Der Mast, an accomplished inventor hailing from Eindhoven, Netherlands, has made significant contributions to the field of microscopy. With a remarkable portfolio of 19 patents, Van Der Mast has significantly advanced the technology of scanning electron microscopes, enhancing their functionality and performance.

Latest Patents

Among his latest inventions is a sophisticated scanning electron microscope. This innovative microscope incorporates a sliding vacuum seal connecting the electron optical imaging system with the sample carrier. It features a first plate that has an aperture linked to the imaging system and a second plate with an aperture related to the sample carrier. Furthermore, at least one of these plates is designed with a groove encircling the aperture. The microscope also boasts a movable detector relative to the electron beam and a motion control unit to maneuver the sample carrier along a collision-free path, highlighting Van Der Mast's commitment to efficiency and precision in imaging technology.

Career Highlights

Karel D Van Der Mast has had an impressive career, having worked with notable companies such as U.S. Philips Corporation and Phenom-World Holding B.V. His contributions at these firms have helped shape the landscape of optical imaging and scientific research.

Collaborations

Throughout his career, Van Der Mast has collaborated with several gifted professionals, including Adrianus Franciscus Johannes Hammen and Sander Richard Marie Stoks. These partnerships have fostered innovation and contributed to the success of his projects, leading to advancements in microscopy technology.

Conclusion

Karel D Van Der Mast is a distinguished inventor whose work in scanning electron microscopy continues to impact the field of scientific research. With his extensive experience and dedication to innovation, Van Der Mast remains a significant figure in the quest for improved imaging technologies, further solidifying his legacy in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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