Tokyo, Japan

Junko Tanaka

USPTO Granted Patents = 10 

Average Co-Inventor Count = 5.1

ph-index = 2

Forward Citations = 43(Granted Patents)


Location History:

  • Kawaguchi, JP (1995)
  • Tokyo, JP (1992 - 2024)

Company Filing History:


Years Active: 1992-2025

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10 patents (USPTO):Explore Patents

Title: Junko Tanaka: Innovator in Measurement Technology

Introduction

Junko Tanaka is a prominent inventor based in Tokyo, Japan, known for her significant contributions to measurement technology. With a total of 10 patents to her name, she has developed innovative solutions that enhance the accuracy and efficiency of measurement devices.

Latest Patents

Among her latest patents are a measurement cell manufacturing method and a digital PCR measuring device. The measurement cell manufacturing method provides a technique capable of producing a measurement cell with a high specimen utilization ratio when introducing a specimen into a surface hole. This method includes a channel wall that protrudes from the lower surface substrate toward the through-hole, allowing for effective specimen introduction. The digital PCR measuring device is designed to measure melting curves with high accuracy. It features a temperature adjuster that controls the temperature of a sample container containing multiple minute regions, along with a fluorescence measurement part that assesses fluorescence intensity. The device's controller manages the temperature adjustments and measures the melting curve of the sample regions.

Career Highlights

Throughout her career, Junko Tanaka has worked with notable companies such as Hitachi, Ltd. and Joled Inc. Her experience in these organizations has contributed to her expertise in measurement technologies and innovation.

Collaborations

Some of her coworkers include Tatsuo Nakagawa and Yuzuru Shimazaki, who have collaborated with her on various projects, further enhancing her contributions to the field.

Conclusion

Junko Tanaka's work in measurement technology exemplifies her innovative spirit and dedication to advancing scientific methods. Her patents reflect her commitment to improving measurement accuracy and efficiency, making her a significant figure in her field.

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