The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2024

Filed:

May. 20, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Junko Tanaka, Tokyo, JP;

Tatsuo Nakagawa, Tokyo, JP;

Yuzuru Shimazaki, Tokyo, JP;

Kunio Harada, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12P 19/34 (2006.01); B01L 3/00 (2006.01); C12Q 1/6825 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6825 (2013.01); B01L 3/5027 (2013.01); B01L 2200/147 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0883 (2013.01); B01L 2400/0415 (2013.01); B01L 2400/0487 (2013.01); C12Q 2531/113 (2013.01); C12Q 2563/107 (2013.01);
Abstract

The present invention addresses the problem of providing a novel digital PCR analysis method. One embodiment of the novel digital PCR analysis method is a DNA detection method including the steps of: partitioning a DNA solution containing a fluorescent-labeled probe or a DNA intercalator and a target DNA to be detected into a plurality of compartments; carrying out a nucleic acid amplification reaction in the compartments; measuring a fluorescence intensity in association with a temperature change; calculating a melting temperature of a DNA double strand based on a change in the fluorescence intensity in association with the temperature change; and calculating a ratio of a fluorescence intensity at a second temperature that is lower than a first temperature in association with the temperature change to that at the first temperature.


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