The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Apr. 02, 2020
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Yuzuru Shimazaki, Tokyo, JP;
Tatsuo Nakagawa, Tokyo, JP;
Junko Tanaka, Tokyo, JP;
Akiko Shiratori, Tokyo, JP;
Chihiro Uematsu, Tokyo, JP;
Assignee:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01); G01N 21/03 (2006.01); G01N 35/08 (2006.01); G01N 37/00 (2006.01);
U.S. Cl.
CPC ...
C12M 1/34 (2013.01); G01N 21/03 (2013.01); G01N 35/08 (2013.01); G01N 37/00 (2013.01);
Abstract
The present disclosure provides a technique capable of manufacturing a measurement cell having a high specimen utilization ratio in the case of using a measurement cell that introduces a specimen into a surface hole. In the measurement cell manufacturing method according to the present disclosure, a measurement cell includes a channel wall protruding from the lower surface substrate toward the through-hole, and a specimen solution is introduced into a lower surface side space to introduce the specimen into the through-hole.