The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Feb. 26, 2020
Hitachi, Ltd., Tokyo, JP;
Tatsuo Nakagawa, Tokyo, JP;
Junko Tanaka, Tokyo, JP;
Yuzuru Shimazaki, Tokyo, JP;
Kunio Harada, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
A digital PCR measuring apparatus capable of measuring a melting curve with high accuracy is provided. The digital PCR measuring apparatus includes a temperature adjuster that controls a temperature of a sample container including a plurality of minute regions, a fluorescence measurement part that measures fluorescence intensity of a plurality of minute regions, and a controller that controls the temperature adjuster and the fluorescence measurement part. The controller controls the temperature adjuster to raise a temperature of the sample container, and, after removing air bubbles generated in the sample container, measures fluorescence intensity of a plurality of minute regions while controlling the temperature adjuster to lower the temperature of the sample container, and measures a melting curve of a plurality of the minute regions.