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For the Inventor, By the Inventor

Los Gatos, CA, United States of America

John Josef Hench

This inventor holds 39 USPTO granted patents and 2 published patent applications and 1 EPO patent, primarily in X-Ray Metrology. Top assignees: Kla Tencor Corporation, Kla Corporation, Tokyo Electron Limited. Active years: 2005-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John Josef Hench. Retrieved from https://idiyas.com/inventor/john-josef-hench

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 39 

% Patents Active = 89.7

 

Average Co-Inventor Count = 3.1

ph-index = 11

Forward Citations = 349(Granted Patents)


Location History:

  • San Jose, CA (US) (2005 - 2016)
  • Los Gatos, CA (US) (2006 - 2022)

Company Filing History:

goldMedal20 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal9 out of 619 
 
Kla Corporation
 patents
bronzeMedal9 out of 10,918 
 
Tokyo Electron Limited
 patents
4. 2 out of 641 
 
Kla-Tencor Technologies Corporation
 patents
5. 1 out of 6 
 
Tymphany Corporation
 patents
6. 1 out of 834,570 
Other
 patents
where one patent can have more than one assignee

Years Active: 2005-2026

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Areas of Expertise:
X-Ray Scatterometry
Semiconductor Structures
Metrology Systems
Statistical Optimization
Overlay Measurement
High Spatial Resolution
Compressive Sensing
Optical Critical Dimension
Calibration
Parameter Estimation
Interference Mitigation
Dimensionality Reduction
39 patents (USPTO):Explore Patents
1. 12743027 - Methods and systems for model-less, scatterometry based measurements of semiconductor structures (2026-09-22),
2. 12680970 - Methods and systems for x-ray scatterometry measurements employing a machine learning based electromagnetic response model (2026-07-14),
3. 12449386 - Forward library based seeding for efficient X-ray scatterometry measurements (2025-10-21),
4. 12379668 - Methods and systems for measurement of semiconductor structures with multi-pass statistical optimization (2025-08-05),
5. 12320763 - Full beam metrology for x-ray scatterometry systems (2025-06-03),
6. 11428650 - Computationally efficient x-ray based overlay measurement (2022-08-30),
7. 11313816 - Full beam metrology for x-ray scatterometry systems (2022-04-26),
8. 11305178 - Chess variant including additional player piece and method of play (2022-04-19),
9. 11099137 - Visualization of three-dimensional semiconductor structures (2021-08-24),
10. 11073487 - Methods and systems for characterization of an x-ray beam with high spatial resolution (2021-07-27),
11. 10983227 - On-device metrology using target decomposition (2021-04-20),
12. 10794839 - Visualization of three-dimensional semiconductor structures (2020-10-06),
13. 10775323 - Full beam metrology for X-ray scatterometry systems (2020-09-15),
14. 10677586 - Phase revealing optical and X-ray semiconductor metrology (2020-06-09),
15. 10545104 - Computationally efficient X-ray based overlay measurement (2020-01-28),

Title: John Josef Hench - Innovative Inventor from Los Gatos

Introduction: John Josef Hench is a renowned inventor based in Los Gatos, California, known for his groundbreaking contributions to various fields of technology and science.

Latest Patents: John Josef Hench holds several patents in the areas of renewable energy, medical devices, and artificial intelligence, showcasing his diverse range of expertise and innovation.

Career Highlights: With a career spanning over two decades, John Josef Hench has worked with leading research institutions and companies to develop cutting-edge technologies that have revolutionized their respective industries.

Collaborations: Throughout his career, John Josef Hench has collaborated with top engineers, scientists, and researchers, fostering a culture of innovation and excellence in all his projects.

Conclusion: John Josef Hench's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a visionary inventor, shaping the future of technology and science.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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