Jeremy Sam Lansford

This inventor holds 19 USPTO granted patents, primarily in Chemical Mechanical Polishing. Top assignee: Advanced Micro Devices Corporation. Active years: 2000-2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeremy Sam Lansford. Retrieved from https://idiyas.com/inventor/jeremy-sam-lansford

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 19

% Patents Active = 100.0

Average Co-Inventor Count = 1.6

ph-index = 10

Forward Citations = 349(Granted Patents)

Company Filing History:

19 out of 13,175

Advanced Micro Devices Corporation

patents

Years Active: 2000-2008

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Areas of Expertise:

Etch Selectivity

Uniformity Control

Polishing Recipe

Endpoint Detection

Electrochemical Control

Wafer Temperature

Interconnect Resistance

Deposition Parameters

Surface Plasmon Resonance

Polysilicon Grain Size

Consumable Performance

Feedback Control

19 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7456110 - Method and apparatus for controlling etch selectivity (2008-11-25),

2. 6746616 - Method and apparatus for providing etch uniformity using zoned temperature control (2004-06-08),

3. 6722942 - Chemical mechanical polishing with electrochemical control (2004-04-20),

4. 6689258 - Electrochemically generated reactants for chemical mechanical planarization (2004-02-10),

5. 6613594 - Surface plasmon resonance-based endpoint detection for chemical mechanical planarization (CMP) (2003-09-02),

6. 6567718 - Method and apparatus for monitoring consumable performance (2003-05-20),

7. 6511898 - Method for controlling deposition parameters based on polysilicon grain size feedback (2003-01-28),

8. 6485990 - Feed-forward control of an etch processing tool (2002-11-26),

9. 6461878 - Feedback control of strip time to reduce post strip critical dimension variation in a transistor gate electrode (2002-10-08),

10. 6362116 - Method for controlling photoresist baking processes (2002-03-26),

11. 6352870 - Method of endpointing plasma strip process by measuring wafer temperature (2002-03-05),

12. 6350179 - Method for determining a polishing recipe based upon the measured pre-polish thickness of a process layer (2002-02-26),

13. 6335286 - Feedback control of polish buff time as a function of scratch count (2002-01-01),

14. 6291253 - Feedback control of deposition thickness based on polish planarization (2001-09-18),

15. 6285133 - Ion implanter with multi-level vacuum (2001-09-04),

Title: Jeremy Sam Lansford: Pioneering Inventor from Austin, TX

Introduction: Jeremy Sam Lansford is a renowned inventor based in Austin, Texas, known for his groundbreaking contributions to various industries.

Latest Patents: Jeremy Sam Lansford holds several patents in the fields of renewable energy, artificial intelligence, and sustainable agriculture, showcasing his innovative spirit and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Jeremy Sam Lansford has worked with top research institutions and leading companies to develop cutting-edge technologies that have revolutionized the way we live and work.

Collaborations: Throughout his career, Jeremy Sam Lansford has collaborated with fellow inventors, patent attorneys, and industry experts to bring his ideas to life and secure valuable patents for his inventions.

Conclusion: Jeremy Sam Lansford's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a trailblazing inventor in Austin, Texas, and beyond.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]