logo

For the Inventor, By the Inventor

Gyeonggi-do, South Korea

Jeong-Ho Bang

This inventor holds 17 USPTO granted patents. Top assignees: Samsung Electronics Co., Ltd., Isc Technology Co., Ltd.. Active years: 1997-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeong-Ho Bang. Retrieved from https://idiyas.com/inventor/jeong-ho-bang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 17

% Patents Active = 82.4

Average Co-Inventor Count = 3.5

ph-index = 5

Forward Citations = 77(Granted Patents)


Location History:

  • Suwon, KR (1997 - 1998)
  • Chonan, KR (2003)
  • Gyeonggi-do, KR (2005 - 2008)
  • Kyunggi-do, KR (2005 - 2009)
  • Yongin-si, KR (2009)

Company Filing History:

goldMedal17 out of 132,108 
 
Samsung Electronics Co., Ltd.
 patents
silverMedal1 out of 2 
 
Isc Technology Co., Ltd.
 patents
where one patent can have more than one assignee

Years Active: 1997-2009

Loading Chart...
17 patents (USPTO):Explore Patents
1. 7602172 - Test apparatus having multiple head boards at one handler and its test method (2009-10-13),
2. 7492032 - Fuse regions of a semiconductor memory device and methods of fabricating the same (2009-02-17),
3. 7438563 - Connector for testing a semiconductor package (2008-10-21),
4. 7408339 - Test system of semiconductor device having a handler remote control and method of operating the same (2008-08-05),
5. 7378864 - Test apparatus having multiple test sites at one handler and its test method (2008-05-27),
6. 7327154 - Multichip package test (2008-02-05),
7. 7254757 - Flash memory test system and method capable of test time reduction (2007-08-07),
8. 7230417 - Test system of semiconductor device having a handler remote control and method of operating the same (2007-06-12),
9. 7227351 - Apparatus and method for performing parallel test on integrated circuit devices (2007-06-05),
10. 7084655 - Burn-in test apparatus for BGA packages using forced heat exhaust (2006-08-01),
11. 6960908 - Method for electrical testing of semiconductor package that detects socket defects in real time (2005-11-01),
12. 6943577 - Multichip package test (2005-09-13),
13. 6922050 - Method for testing a remnant batch of semiconductor devices (2005-07-26),
14. 6903567 - Test apparatus having multiple test sites at one handler and its test method (2005-06-07),
15. 6507801 - Semiconductor device testing system (2003-01-14),

Title: Jeong-Ho Bang: Innovator in Semiconductor Testing Technologies

Introduction

Jeong-Ho Bang is a prominent inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of semiconductor testing, holding a total of 17 patents. His innovative approaches have optimized testing processes, enhancing efficiency in the semiconductor industry.

Latest Patents

One of his latest patents is a test apparatus having multiple head boards at one handler and its test method. This apparatus includes one handler connected to a tester and one test board divided into two or more sites or two or more test boards. By duplicating only the sites on the test board, rather than the loading lanes or sorters of the handler, the test apparatus can be conveniently compact. This design allows for simultaneous testing of semiconductor devices on one site while sorting devices in another, effectively reducing tester idle time and optimizing efficiency. Another notable patent is related to fuse regions of a semiconductor memory device and methods of fabricating the same. This invention discloses a device and method for manufacturing a fuse region, which includes an interlayer insulating layer, a plurality of fuses, and fuse isolation walls, enhancing the reliability and performance of semiconductor devices.

Career Highlights

Throughout his career, Jeong-Ho Bang has worked with leading companies in the technology sector, including Samsung Electronics Co., Ltd. and Isc Technology Co., Ltd. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in semiconductor technology.

Collaborations

Jeong-Ho has collaborated with notable colleagues such as Ae-Yong Chung and Sung-Ok Kim. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies in the semiconductor field.

Conclusion

Jeong-Ho Bang's contributions to semiconductor testing technologies have established him as a key figure in the industry. His innovative patents and collaborations continue to influence advancements in semiconductor efficiency and reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…