The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2007
Filed:
Sep. 29, 2004
Dong-kyoo Park, Gyeonggi-do, KR;
Jong-kook Kim, Chungcheongnam-do, KR;
Jeong-ho Bang, Gyeonggi-do, KR;
Sang-young Choi, Gyeonggi-do, KR;
Eun-sik Kim, Chungcheongnam-do, KR;
Dong-Kyoo Park, Gyeonggi-do, KR;
Jong-Kook Kim, Chungcheongnam-do, KR;
Jeong-Ho Bang, Gyeonggi-do, KR;
Sang-Young Choi, Gyeonggi-do, KR;
Eun-Sik Kim, Chungcheongnam-do, KR;
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Abstract
A flash memory test system capable of test time reduction and an electrical test method using the same: The invention provides a parallel tester that includes a first memory and a second memory. The first and second memories are used to each supply different data to identical addresses within a plurality of DUTs, thereby making it possible to conduct in parallel tests such as trim tests, repair tests, and invalid block masking test. Thus parallel testing is done to replace testing that was previously done serially.