The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
May. 15, 2007
Test system of semiconductor device having a handler remote control and method of operating the same
Ae-yong Chung, Chungcheongnam-do, KR;
Eun-seok Lee, Chungcheongnam-do, KR;
Jeong-ho Bang, Gyeonggi-do, KR;
Kyeong-seon Shin, Gyeonggi-do, KR;
Dae-gab Chi, Gyeonggi-do, KR;
Sung-ok Kim, Chungcheongnam-do, KR;
Ae-Yong Chung, Chungcheongnam-do, KR;
Eun-Seok Lee, Chungcheongnam-do, KR;
Jeong-Ho Bang, Gyeonggi-do, KR;
Kyeong-Seon Shin, Gyeonggi-do, KR;
Dae-Gab Chi, Gyeonggi-do, KR;
Sung-Ok Kim, Chungcheongnam-do, KR;
Samsung Electronics Co., Ltd., Suown-si, Gyeonggi-do, KR;
Abstract
A test system of a semiconductor device for a handler remote control is provided. The system includes: a tester for testing the semiconductor device; a handler connected to the tester through a GPIB (General Purpose Instruction Bus) communication cable; a tester server connected to the tester to download a test program, handler remote control program and a handler state check program to the tester; and communication data transmitted and received through the GPIB communication cable between the tester and the handler, wherein the communication data has basic communication data for an electrical test of the semiconductor device, communication data for the handler remote control, and communication data for a handler state check.