The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2007
Filed:
May. 27, 2004
Woo-il Kim, Chungcheongnam-do, KR;
Hyun-seop Shim, Incheon-si, KR;
Hyoung-young Lee, Gyeonggi-do, KR;
Young-ki Kwak, Chungcheongnam-do, KR;
Jeong-ho Bang, Gyeonggi-do, KR;
Ki-bong Ju, Gyeonggi-do, KR;
Woo-Il Kim, Chungcheongnam-do, KR;
Hyun-Seop Shim, Incheon-si, KR;
Hyoung-Young Lee, Gyeonggi-do, KR;
Young-Ki Kwak, Chungcheongnam-do, KR;
Jeong-Ho Bang, Gyeonggi-do, KR;
Ki-Bong Ju, Gyeonggi-do, KR;
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Abstract
Embodiments of the invention connect a plurality of devices under test (DUTS) in a parallel manner and a high test current is selectively applied to each DUT. The apparatus to test a plurality of DUTs includes a plurality of power sources providing the test current to a plurality of DUTs; and switching devices connected to the respective DUTs and power sources and selectively providing the test current. In addition, the apparatus has at least one control unit to control the switching devices. Furthermore, a group of DUTs from the plurality of DUTs is connected between two of the plurality of power sources in a parallel manner, and the test current is selectively provided to one DUT from the group of DUTs according to the operation of the switching devices.