The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Apr. 13, 2004
Ae-yong Chung, Chungcheongnam-do, KR;
Sung-ok Kim, Chungcheongnam-do, KR;
Jeong-ho Bang, Kyunggi-do, KR;
Kyeong-seon Shin, Kyunggi-do, KR;
Dae-gab Chi, Kyunggi-do, KR;
Ae-yong Chung, Chungcheongnam-do, KR;
Sung-Ok Kim, Chungcheongnam-do, KR;
Jeong-ho Bang, Kyunggi-do, KR;
Kyeong-seon Shin, Kyunggi-do, KR;
Dae-gab Chi, Kyunggi-do, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
An electrical testing method for a semiconductor package for detecting defects of sockets mounted on a device under test (DUT) board is provided. A tester performs electrical test, accumulates electrical test results, and compares the accumulated results to reference values. The result of the comparison decides whether a plurality of sockets mounted on the DUT board can be used or not. The decision results are transmitted to a handler so that the socket having the defects is not used on the DUT board.