Dae-gab Chi

Title: Dae-gab Chi: Innovator in Semiconductor Testing Technology

Introduction

Dae-gab Chi is a prominent inventor based in Kyunggi-do, South Korea. He has made significant contributions to the field of semiconductor technology, particularly in the area of electrical testing methods. His innovative approach has led to the development of a patented technology that enhances the reliability of semiconductor packages.

Latest Patents

Dae-gab Chi holds a patent for a "Method for electrical testing of semiconductor package that detects socket defects in real time." This method provides an efficient electrical testing solution for semiconductor packages by detecting defects in sockets mounted on a device under test (DUT) board. The testing process involves accumulating electrical test results and comparing them to reference values. The outcome of this comparison determines the usability of the sockets on the DUT board, ensuring that defective sockets are identified and excluded from use.

Career Highlights

Dae-gab Chi is currently employed at Samsung Electronics Co., Ltd., a leading global technology company. His work at Samsung has allowed him to be at the forefront of semiconductor innovation, contributing to advancements that improve product quality and performance.

Collaborations

Some of Dae-gab Chi's notable coworkers include Ae-Yong Chung and Sung-Ok Kim. Their collaborative efforts in the field of semiconductor technology have further enhanced the development of innovative solutions.

Conclusion

Dae-gab Chi's contributions to semiconductor testing technology exemplify the importance of innovation in the electronics industry. His patented method not only improves testing efficiency but also ensures the reliability of semiconductor packages.