Cupertino, CA, United States of America

Ho-yung David Hwang

This inventor holds 30 USPTO granted patents and 11 published patent applications, primarily in Semiconductor Processing. Top assignees: Applied Materials, Inc., Micro Materials Inc., Mirocmaterials LLC. Active years: 2019-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ho-yung David Hwang. Retrieved from https://idiyas.com/inventor/ho-yung-david-hwang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 30 

% Patents Active = 70.0

Average Co-Inventor Count = 4.6

ph-index = 3

Forward Citations = 31(Granted Patents)


Company Filing History:


Years Active: 2019-2026

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Areas of Expertise:
Ion Implantation
Electrode Tuning
Boron Films
Atomic Layer Etching
EUV Resist
Multicolor Patterning
DRAM Capacitor
Self-Aligned Vias
Subtractive Etch
Patterning Applications
Metal Oxide Photoresists
Interconnect Formation
30 patents (USPTO):Explore Patents

Title: The Innovative Journey of Ho-yung David Hwang

Introduction: Ho-yung David Hwang is a visionary inventor based in Cupertino, CA. His groundbreaking work has significantly impacted various industries and technologies.

Latest Patents: Ho-yung David Hwang holds several patents in the fields of technology and engineering, showcasing his continuous commitment to innovation and creativity.

Career Highlights: Throughout his illustrious career, Ho-yung David Hwang has been recognized for his exceptional problem-solving skills and forward-thinking approach. His contributions have led to advancements in cutting-edge technologies.

Collaborations: Ho-yung David Hwang has collaborated with leading experts and organizations in the industry, fostering a culture of innovation and knowledge-sharing that has propelled his work to new heights.

Conclusion: Ho-yung David Hwang's passion for innovation and relentless pursuit of excellence make him a true pioneer in the world of inventions, with a lasting impact on the technological landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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