Tokyo, Japan

Hisashi Hatano

USPTO Granted Patents = 15 

Average Co-Inventor Count = 3.4

ph-index = 3

Forward Citations = 46(Granted Patents)


Location History:

  • Kamisato, JP (2008 - 2012)
  • Hitachinaka, JP (2014 - 2015)
  • Tokyo, JP (1991 - 2020)

Company Filing History:


Years Active: 1991-2020

where 'Filed Patents' based on already Granted Patents

15 patents (USPTO):

As an assistant specialized in innovations, inventions, inventors, patent attorneys, assignees, and patents, I'm happy to assist you with the article about inventor Hisashi Hatano based on the given data.

Title: Innovator Spotlight: Hisashi Hatano - Revolutionizing Defect Inspection

Introduction: Hisashi Hatano, a distinguished inventor hailing from Tokyo, JP, has made significant contributions in the field of defect inspection with an impressive portfolio of 15 patents.

Latest Patents: Among his recent patents are the "Defect Inspection Device and Defect Inspection Method" that focuses on accurately identifying defects in an inspection target by extracting feature amounts and enabling adjustments of defect extraction parameters. Additionally, the "Flaw Inspection Device and Flaw Inspection Method" simplifies the process of setting parameters for defect detection, enhancing user experience.

Career Highlights: Hisashi Hatano has showcased his expertise at esteemed companies like Hitachi High-Technologies Corporation and Hitachi High-Tech Corporation, where he honed his skills and developed groundbreaking solutions in defect inspection technology.

Collaborations: Throughout his career, Hisashi Hatano has collaborated with talented individuals such as Takahiro Jingu and Toshifumi Honda, pooling their knowledge and expertise to drive innovation in defect inspection methodologies.

Conclusion: Hisashi Hatano's dedication to advancing defect inspection techniques and his innovative solutions highlight his commitment to excellence in the field. His contributions continue to shape the industry, setting new standards for efficient and effective defect detection technologies.

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