The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2016

Filed:

Jul. 27, 2012
Applicants:

Masaaki Ito, Tokyo, JP;

Takahiro Jingu, Tokyo, JP;

Hisashi Hatano, Tokyo, JP;

Inventors:

Masaaki Ito, Tokyo, JP;

Takahiro Jingu, Tokyo, JP;

Hisashi Hatano, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01N 21/55 (2014.01); G01B 11/30 (2006.01); G01N 21/47 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/303 (2013.01); G01N 21/4738 (2013.01); G01N 21/55 (2013.01); G01B 2210/56 (2013.01); G01N 21/9501 (2013.01);
Abstract

In related art, consideration is not given to that a spatial distribution of scattered light changes in various direction such as forward/backward/sideways according to a difference in micro roughness. Particularly, although a step-terrace structure appearing on an epitaxial growth wafer produces anisotropy in the scattered light distribution, consideration is not given to this point in the related art. The invention includes a process in which light is illuminated to a sample surface, plural detection optical systems mutually different in directions of optical axes detect a spatial distribution of scattered light, and a spatial frequency spectrum of the sample surface is calculated.


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