Tokyo, Japan

Hisao Asakura


Average Co-Inventor Count = 2.7

ph-index = 6

Forward Citations = 126(Granted Patents)


Location History:

  • Ohme, JP (2000)
  • Ome, JP (2000 - 2004)
  • Oume, JP (2004)
  • Tokyo, JP (2004 - 2005)

Company Filing History:


Years Active: 2000-2005

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13 patents (USPTO):

Title: Hisao Asakura: Innovator in Electronic Device Manufacturing

Introduction

Hisao Asakura is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of electronic device manufacturing, holding a total of 13 patents. His innovative methods focus on improving test efficiency and yield in manufacturing processes.

Latest Patents

Asakura's latest patents include a method for test conditions and a photomask for test wafers. The method for test conditions enhances test efficiency by utilizing a first lead wire on an insulating layer formed on a substrate and a second lead wire connected to the substrate. This method manages the electronic device based on test results, ensuring high-quality manufacturing. It includes steps to test for disconnections and short circuits by measuring electric resistance between the lead wires and the substrate.

Career Highlights

Throughout his career, Hisao Asakura has worked with notable companies, including Hitachi, Ltd. His experience in these organizations has allowed him to refine his skills and contribute to advancements in electronic device technology.

Collaborations

Asakura has collaborated with several talented individuals in his field, including Yuichi Hamamura and Takaaki Kumazawa. Their teamwork has fostered innovation and led to the development of effective manufacturing methods.

Conclusion

Hisao Asakura's work in electronic device manufacturing showcases his dedication to innovation and efficiency. His patents reflect a commitment to improving manufacturing processes, making him a significant figure in the industry.

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