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Hirokatsu Niijima

This inventor holds 10 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 1998-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hirokatsu Niijima. Retrieved from https://idiyas.com/inventor/hirokatsu-niijima

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 10

% Patents Active = 60.0

Average Co-Inventor Count = 1.4

ph-index = 5

Forward Citations = 42(Granted Patents)

Location History:

Gyoda, JP (1998 - 1999)
Tokyo, JP (2004 - 2011)

Company Filing History:

10 out of 2,281

Adv Antest Corporation

Years Active: 1998-2011

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10 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8014969 - Test apparatus, test method and manufacturing method (2011-09-06),

2. 7447955 - Test apparatus and test method (2008-11-04),

3. 7409615 - Test apparatus and test method (2008-08-05),

4. 7262627 - Measuring apparatus, measuring method, and test apparatus (2007-08-28),

5. 7197682 - Semiconductor test device and timing measurement method (2007-03-27),

6. 7100099 - Test apparatus (2006-08-29),

7. 7002334 - Jitter measuring apparatus and a testing apparatus (2006-02-21),

8. 6768954 - Jitter quantity calculator and tester (2004-07-27),

9. 5955907 - Temperature compensation circuit and method for providing a constant (1999-09-21),

10. 5732047 - Timing comparator circuit for use in device testing apparatus (1998-03-24),

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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