The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2008
Filed:
Jul. 28, 2006
Applicants:
Hiroaki Nishimine, Tokyo, JP;
Hirokatsu Niijima, Tokyo, JP;
Takeo Miura, Tokyo, JP;
Inventors:
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test apparatus for testing a device under testis provided. The test apparatus includes a driverfor applying a test signal to the device under test, a comparatorfor comparing a result signal outputted by the device under testcorresponding to the applied test signal with a predetermined reference voltage and a setting voltage output sectionfor setting the voltage of the test signal to a predetermined voltage value to cause the driverto terminate the transmission path of the result signal when the test apparatus reads from the device under test