Tokyo, Japan

Hiroaki Nishimine

This inventor holds 1 USPTO granted patent. Top assignee: Adv Antest Corporation. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroaki Nishimine. Retrieved from https://idiyas.com/inventor/hiroaki-nishimine-mjktp28a

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Hiroaki Nishimine: Innovator in Test Apparatus Technology

Introduction

Hiroaki Nishimine is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of testing technology, particularly through his innovative patent related to test apparatuses. His work is recognized for enhancing the efficiency and accuracy of device testing.

Latest Patents

Hiroaki Nishimine holds a patent for a "Test apparatus and test method." This invention provides a test apparatus designed for testing a device under test. The apparatus includes a driver that applies a test signal to the device, a comparator that compares the result signal outputted by the device with a predetermined reference voltage, and a setting voltage output section that sets the voltage of the test signal to a predetermined value. This design allows the driver to terminate the transmission path of the result signal when the test apparatus reads from the device under test. He has 1 patent to his name.

Career Highlights

Hiroaki Nishimine is associated with Adv Antest Corporation, where he continues to develop and refine testing technologies. His expertise in this area has positioned him as a valuable asset to his company and the industry at large.

Collaborations

Hiroaki Nishimine collaborates with his coworker, Hirokatsu Niijima, to further advance their projects and innovations in testing technology.

Conclusion

Hiroaki Nishimine's contributions to the field of test apparatus technology demonstrate his commitment to innovation and excellence. His patent reflects a significant advancement in the testing process, showcasing his role as a key inventor in this domain.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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