The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2011
Filed:
Dec. 27, 2007
Hirokatsu Niijima, Tokyo, JP;
Koji Hara, Tokyo, JP;
Noriyoshi Kozuka, Tokyo, JP;
Kohei Shibata, Tokyo, JP;
Tetsuya Sakaniwa, Tokyo, JP;
Hirokatsu Niijima, Tokyo, JP;
Koji Hara, Tokyo, JP;
Noriyoshi Kozuka, Tokyo, JP;
Kohei Shibata, Tokyo, JP;
Tetsuya Sakaniwa, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
There is provided a test apparatus for testing a plurality of devices under test. The test apparatus includes a signal input section that applies a test signal to the devices under test so as to cause the devices under test to concurrently output response signals, a combining section that generates a single combination signal by using the response signals output from the devices under test, and a judging section that judges whether the devices under test operate normally with reference to the combination signal.