The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 1998
Filed:
Dec. 09, 1996
Applicant:
Inventor:
Hirokatsu Niijima, Gyoda, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G04B / ; G04F / ; G01R / ;
U.S. Cl.
CPC ...
368 10 ; 368113 ; 324 731 ; 371 211 ; 371 251 ;
Abstract
A timing comparator circuit for use in device testing apparatus is provided which can eliminate, in the window comparison mode, an off time during which a failure cannot be detected. There are provided first and second window strobe pulse generating circuits S/RFF1 and S/RFF2 for alternately generating window strobe pulses, first and second failure detecting circuits 5a and 5b for detecting whether a failure signal exists or not in the output signals from a level comparator 2 during the pulse duration of each window strobe pulse supplied thereto from the first and the second window strobe pulse generating circuits, and first and second interleave circuits.