Company Filing History:
Years Active: 2012-2023
Title: Ge Cong - Innovator in Deep Learning and Defect Detection
Introduction
Ge Cong is a prominent inventor based in Pleasanton, CA (US). He has made significant contributions to the field of deep learning and defect detection, holding a total of 8 patents. His innovative work focuses on developing methods and systems that enhance the accuracy and efficiency of defect detection processes.
Latest Patents
One of Ge Cong's latest patents is centered around deep learning-based defect detection. This patent outlines methods and systems for detecting defects on a specimen. The system includes one or more computer systems and components executed by these systems. The components feature a deep learning model that generates a gray scale simulated design data image from a high-resolution image captured at a specific location on the specimen. The computer systems are designed to create a simulated binary design data image from the gray scale image. Additionally, they are configured to detect defects by comparing the design data for the location with the simulated binary design data image.
Another notable patent involves setting up the inspection of a specimen. This system comprises computer subsystems that acquire a reference image and modify it to fit a design grid, resulting in a golden grid image. The subsystems store this golden grid image for future inspections. The inspection process includes aligning a test image of the specimen with the golden grid image to ensure accuracy.
Career Highlights
Ge Cong has worked with Kla Corporation, where he applied his expertise in deep learning and defect detection. His work has significantly impacted the industry, leading to advancements in inspection technologies.
Collaborations
Ge Cong has collaborated with notable professionals in his field, including Lijun Wu and Boshi Huang. These collaborations have contributed to the development of innovative solutions in defect detection and inspection processes.
Conclusion
Ge Cong is a distinguished inventor whose work in deep learning and defect detection has led to multiple patents and advancements in technology. His contributions continue to influence the field and inspire future innovations.