The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 2016
Filed:
Jan. 30, 2014
Applicants:
GE Cong, Pleasanton, CA (US);
Lijun Wu, Pleasanton, CA (US);
Richard Cong, Pleasanton, CA (US);
Inventors:
Assignee:
Other;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G06T 7/00 (2006.01); G01N 33/558 (2006.01); G01N 21/84 (2006.01); G01N 33/543 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G06T 7/00 (2013.01); G01N 21/8483 (2013.01); G01N 33/54393 (2013.01); G01N 33/558 (2013.01); G01N 2021/1748 (2013.01);
Abstract
Techniques for fast and accurate measuring test strip intensities are disclosed herein. A method for measuring a test strip intensity comprising steps of obtaining an image of a sample line in a test strip and a plurality of reference lines, wherein the reference lines have known intensities; determining grayscale values of the sample line and the reference lines from the image; constructing a standard curve based on the grayscale values versus the known intensities of the reference lines; and determining the intensity of the sample line by fitting the grayscale value of the sample line on the standard curve.